Annual Reliability and Maintainability Symposium, 2007 proceedings : the International Symposium on Product Quality and Integrity, Orland, Florida, USA, 2007 January 22-25

Bibliographic Information

Annual Reliability and Maintainability Symposium, 2007 proceedings : the International Symposium on Product Quality and Integrity, Orland, Florida, USA, 2007 January 22-25

Institute of Electrical and Electronics Engineers, c2007

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Note

"IEEE catalog number: 07CH37821C"--T. p. verso

Details

  • NCID
    BA82184226
  • ISBN
    • 0780397673
  • LCCN
    78132873
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Piscataway, NJ
  • Pages/Volumes
    1 CD-ROM
  • Size
    12 cm
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