Roadmap of scanning probe microscopy
著者
書誌事項
Roadmap of scanning probe microscopy
（Nanoscience and technology）
Springer, c2007
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注記
Includes bibliographical references and index
内容説明・目次
内容説明
Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.
目次
Science and Technology in the Twenty-First Century.- Scanning Tunneling Microscopy.- Atomic Force Microscopy.- Near-Field Scanning Optical Microscope.- Scanning Capacitance Microscope.- Electrostatic Force Microscopy.- Magnetic Force Microscope.- STM-Induced Photon Emission Spectroscopy.- Scanning Atom Probe.- Chemical Discrimination of Atoms and Molecules.- Manipulation of Atoms and Molecules.- Multiprobe SPM.- AFM Measurement in Liquid.- High-Speed SPM.- Scanning Nonlinear Dielectric Microscope.- SPM Coupled with External Fields.- Probe Technology.- Characterization of Semiconducting Materials.- Evaluation of SPM for LSI Devices.- SPM Characterization of Catalysts.- SPM Characterization of Biomaterials.- SPM Characterization of Organic and Polymeric Materials.- Theories of SPM.- When Will SPM Realize Our Dreams? The Roadmap of SPM.
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