ISTFA 2005 : proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center San Jose, California

著者

• International Symposium for Testing and Failure Analysis
• ASM International
• Electronic Device Failure Analysis Society

書誌事項

ISTFA 2005 : proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center San Jose, California

sponsored by EDFAS, ISTFA, ASM International

ASM International, c2005

タイトル別名

ISTFA 2005 : conference proceedings from the 31st International Symposium for Testing and Failure Analysis

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA82541888
• ISBN:
  • 087170823X
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Materials Park, Ohio
• ページ数/冊数: xviii, 523 p.
• 大きさ: 28 cm
• 付属資料: CD-ROM