ISTFA 2006 : proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel Austin, Texas, USA

Author(s)

• International Symposium for Testing and Failure Analysis
• ASM International
• Electronic Device Failure Analysis Society

Bibliographic Information

ISTFA 2006 : proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel Austin, Texas, USA

sponsored by EDFAS, ISTFA, ASM International

ASM International, c2006

Other Title

ISTFA 2006 : conference proceedings from the 32nd International Symposium for Testing and Failure Analysis

Note

Includes bibliographical references and index

Details

• NCID: BA82542698
• ISBN:
  • 9780871708441
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Materials Park, Ohio
• Pages/Volumes: xx, 531 p.
• Size: 28 cm
• Attached Material: CD-ROM