Semiconductor characterization techniques : proceedings of the Topical Conference on Characterization Techniques for Semiconductor Materials and Devices

Author(s)

• Topical Conference on Characterization Techniques for Semiconductor Materials and Devices
• Barnes, Peter A.
• Rozgonyi, George A.
• Electrochemical Society. Electronics Division

Bibliographic Information

Semiconductor characterization techniques : proceedings of the Topical Conference on Characterization Techniques for Semiconductor Materials and Devices

edited by Peter A. Barnes, George A. Rozgonyi, assistant editors, C.L. Anderson ... [et al.]

（Proceedings / [Electrochemical Society], v. 78-3）

Electrochemical Society, c1978

Note

Includes bibliographical references and indexes

"... Topical Conference on Characterization Techniques for Semiconductor Materials and Devices, sponsored by the Electronics Division of the Electrochemical Society, which was held May 21-26, 1978 in Seattle, Washington."--Preface

Details

• NCID: BA83565575
• LCCN: 78067994
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Princeton, N.J.
• Pages/Volumes: xi, 532 p.
• Size: 23 cm
• Classification:
  • LCC : TK7871.85
  • DC : 621.3815/2/028
• Subject Headings:
  • LCSH : Semiconductors -- Testing -- Congresses
• Parent Bibliography ID:
  • BA01323290