Semiconductor characterization techniques : proceedings of the Topical Conference on Characterization Techniques for Semiconductor Materials and Devices

著者

• Topical Conference on Characterization Techniques for Semiconductor Materials and Devices
• Barnes, Peter A.
• Rozgonyi, George A.
• Electrochemical Society. Electronics Division

書誌事項

Semiconductor characterization techniques : proceedings of the Topical Conference on Characterization Techniques for Semiconductor Materials and Devices

edited by Peter A. Barnes, George A. Rozgonyi, assistant editors, C.L. Anderson ... [et al.]

（Proceedings / [Electrochemical Society], v. 78-3）

Electrochemical Society, c1978

注記

Includes bibliographical references and indexes

"... Topical Conference on Characterization Techniques for Semiconductor Materials and Devices, sponsored by the Electronics Division of the Electrochemical Society, which was held May 21-26, 1978 in Seattle, Washington."--Preface

詳細情報

• NII書誌ID(NCID): BA83565575
• LCCN: 78067994
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Princeton, N.J.
• ページ数/冊数: xi, 532 p.
• 大きさ: 23 cm
• 分類:
  • LCC : TK7871.85
  • DC : 621.3815/2/028
• 件名:
  • LCSH : Semiconductors -- Testing -- Congresses
• 親書誌ID:
  • BA01323290