Inside the new TOEIC exam

Author(s)

• Van Metre, Donald

Bibliographic Information

Inside the new TOEIC exam

by Donald Van Metre and the staff of Kaplan test prep and admissions

Kaplan Pub., 2007

Other Title

Inside the new TOEIC exam : your step-by-step guide to scoring higher

Details

• NCID: BA84626234
• ISBN:
  • 9781419591501
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York, NY
• Pages/Volumes: xii, 227 p.
• Size: 17 cm
• Classification:
  • DC20 : 428/.0076
• Subject Headings:
  • LCSH : Test of English for International Communication -- Study guides