Scanning electron microscopy and X-ray microanalysis

Author(s)

Bibliographic Information

Scanning electron microscopy and X-ray microanalysis

Joseph I. Goldstein, Dale E. Newbury ... [et al.]

Springer Science, c2003

3rd ed

Available at  / 13 libraries

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Note

Include subject index

Details

  • NCID
    BA84769592
  • ISBN
    • 9780306472923
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    New York
  • Pages/Volumes
    xix, 690 p.
  • Size
    26 cm.
  • Attached Material
    1 computer laser optical disc
  • Subject Headings
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