Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices

Author(s)

• Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
• Shaffner, Thomas J.
• Schroder, Dieter K.
• Electrochemical Society. Electronics Division
• Electrochemical Society. Dielectrics and Insulation Division

Bibliographic Information

Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices

edited by Thomas J. Shaffner, Dieter K. Schroder

（Proceedings / [Electrochemical Society], v. 88-20）

Electrochemical Society, c1988

Other Title

Diagnostic techniques for semiconductor materials and devices

Note

Includes bibliographical references and indexes

Sponsored by: the Electronics and Dielectrics and Insulation Divisions

Details

• NCID: BA84976826
• LCCN: 88082408
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Pennington, NJ
• Pages/Volumes: vi, 289 p.
• Size: 23 cm
• Classification:
  • LCC : TK7871.85
  • DC20 : 621.381/52
• Subject Headings:
  • LCSH : Semiconductors -- Testing -- Congresses
• Parent Bibliography ID:
  • BA01323290