Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices

著者

• Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
• Shaffner, Thomas J.
• Schroder, Dieter K.
• Electrochemical Society. Electronics Division
• Electrochemical Society. Dielectrics and Insulation Division

書誌事項

Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices

edited by Thomas J. Shaffner, Dieter K. Schroder

（Proceedings / [Electrochemical Society], v. 88-20）

Electrochemical Society, c1988

タイトル別名

Diagnostic techniques for semiconductor materials and devices

注記

Includes bibliographical references and indexes

Sponsored by: the Electronics and Dielectrics and Insulation Divisions

• NII書誌ID(NCID): BA84976826
• LCCN: 88082408
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pennington, NJ
• ページ数/冊数: vi, 289 p.
• 大きさ: 23 cm
• 分類:
  • LCC : TK7871.85
  • DC20 : 621.381/52
• 件名:
  • LCSH : Semiconductors -- Testing -- Congresses
• 親書誌ID:
  • BA01323290