Proceedings of the symposia on reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies

Author(s)

• Rathore, Harzara S.
• Schwartz, G. C.
• Susko, R. A. (Robin A.)
• Electrochemical Society. Dielectrics and Insulation Division
• Electrochemical Society. Electronics Division

Bibliographic Information

Proceedings of the symposia on reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies

edited by Harzara S. Rathore, Geraldine C. Schwartz, Robin A. Susko ; [sponsored by] Dielectrics and Insulation and Electronics divisions

（Proceedings / [Electrochemical Society], v. 89-6）

Electrochemical Society, c1989

Other Title

Reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies

Note

Includes bibliographical references and indexes

"... held during the Fall meeting of the Electrochemical Society, October 9 to 14, 1988"--on pref

Details

• NCID: BA84982807
• LCCN: 89083803
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Pennington, NJ
• Pages/Volumes: viii, 495 p.
• Size: 23 cm
• Classification:
  • LCC : TK7871.85
  • DC20 : 621.381/52
• Subject Headings:
  • LCSH : Semiconductors -- Reliability -- Congresses
  • LCSH : Integrated circuits -- Very large scale integration -- Design and construction -- Congresses
  • LCSH : Metallizing -- Congresses
• Parent Bibliography ID:
  • BA01323290