Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA

Author(s)

• Two- and three-dimensional methods for inspection and metrology
• Harding, Kevin G.
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA

Kevin G. Harding, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 6000）

SPIE, c2005

• pbk.

Note

Previous conference entitled: Two- and three-dimensional vision systems for inspection, control, and metrology

Includes bibliographical references and author index

Description and Table of Contents

Description

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

by "Nielsen BookData"

Details

• NCID: BA85939927
• ISBN:
  • 0819460249
• LCCN: 2006276029
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: 1 v. (various pagings)
• Size: 28 cm
• Classification:
  • LCC : TA1634
  • DC22 : 681/.25
• Subject Headings:
  • LCSH : Computer vision -- Congresses
  • LCSH : Imaging systems -- Congresses
  • LCSH : Three-dimensional display systems -- Congresses
  • LCSH : Quality control -- Optical methods -- Congresses
  • LCSH : Optical measurements -- Congresses
  • LCSH : Metrology -- Congresses
• Parent Bibliography ID:
  • BA0022700X