Automatic inspection and novel instrumentation : 25-26 June 1997, Singapore

Author(s)

• Automatic inspection and novel instrumentation
• Ho, Anthony Tung-Shuen
• Rao, Sreenivas
• Cheng, Lee Ming
• Society of Photo-optical Instrumentation Engineers
• Society of Photo-optical Instrumentation Engineers. Singapore Chapter
• Institute of Physics, Singapore

Bibliographic Information

Automatic inspection and novel instrumentation : 25-26 June 1997, Singapore

Anthony Tung-Shuen Ho, Sreenivas Rao, Lee Ming Cheng, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, SPIE Singapore Chapter, [and] Institute of Physics Singapore ; cosponsored by SPIE Japan Chapter ... [et al.] ; cooperating organizations, Nanyang Technological University (Singapore) ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3185）

SPIE, c1997

Note

Includes bibliographical references and index

Details

• NCID: BA85952302
• ISBN:
  • 0819426121
• LCCN: 98122013
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash., USA
• Pages/Volumes: vii, 170 p.
• Size: 28 cm
• Classification:
  • LCC : TS156.2
  • DC21 : 670.42/5
• Subject Headings:
  • LCSH : Engineering inspection -- Automation -- Congresses
  • LCSH : Quality control -- Optical methods -- Congresses
  • LCSH : Optical detectors -- Industrial applications -- Congresses
  • LCSH : Imaging systems -- Industrial applications -- Congresses
• Parent Bibliography ID:
  • BA0022700X