Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China

Author(s)

• Advanced Materials and Devices for Sensing and Imaging
• Yao, Jianquan
• Ishii, Yukihiro
• Society of Photo-optical Instrumentation Engineers
• Chinese Optical Society
• 上海交通大学 シャンハイ コウツウ ダイガク shang hai jiao tong da xue
• National Natural Science Foundation of China

Bibliographic Information

Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China

Jianquan Yao, Yukihiro Ishii, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] COS--Chinese Optical Society ; cooperating organizations, Shanghai Jiaotong University (China) ... [et al.] ; supported by National Natural Science Foundation of China ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4919）

SPIE, c2002

Note

Includes bibliographical references and index

Details

• NCID: BA85967751
• ISBN:
  • 0819447080
• LCCN: 2003265089
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash., USA
• Pages/Volumes: xiii, 548 p.
• Size: 28 cm
• Classification:
  • LCC : TK8360.O67
  • DC21 : 681/.25
• Subject Headings:
  • LCSH : Optical fiber detectors -- Materials -- Congresses
  • LCSH : Detectors -- Materials -- Congresses
  • LCSH : Optoelectronic devices -- Materials -- Congresses
  • LCSH : Photonics -- Congresses
  • LCSH : Metrology -- Congresses
• Parent Bibliography ID:
  • BA0022700X