Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA

著者

• Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies
• Duparré, Angela
• Singh, Bhanwar
• Society of Photo-optical Instrumentation Engineers

書誌事項

Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA

Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 5188）

SPIE, c2003

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA85970530
• ISBN:
  • 0819450618
• LCCN: 2004298723
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: x, 402 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TA1750
  • DC22 : 621.381/045
• 件名:
  • LCSH : Optoelectronics -- Congresses
  • LCSH : Optoelectronic devices -- Congresses
  • LCSH : Optical measurements -- Congresses
  • LCSH : Semiconductors -- Characterization -- Congresses
  • LCSH : Thin films -- Optical properties -- Congresses
  • LCSH : Nanotechnology -- Congresses
• 親書誌ID:
  • BA0022700X