Fabrication, testing, and reliability of semiconductor lasers III : 29-30 January, 1998, San Jose, California

著者

• Fallahi, Mahmoud
• Linden, Kurt J.
• Wang, S. C. (Shing Chung)
• Society of Photo-optical Instrumentation Engineers

書誌事項

Fabrication, testing, and reliability of semiconductor lasers III : 29-30 January, 1998, San Jose, California

Mahmoud Fallahi, Kurt J. Linden, S.C. Wang, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3285）

SPIE, c1998

タイトル別名

Fabrication, testing, and reliability of semiconductor lasers 3

Fabrication, testing, and reliability of semiconductor lasers three

注記

Includes bibliographical references and author index

• NII書誌ID(NCID): BA86055145
• ISBN:
  • 0819427241
• LCCN: 2004297445
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Washington
• ページ数/冊数: viii, 232 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TA1700
  • DC22 : 621.36/6
• 件名:
  • LCSH : Semiconductor lasers -- Design and construction -- Congresses
• 親書誌ID:
  • BA0022700X