Fabrication, testing, and reliability of semiconductor lasers III : 29-30 January, 1998, San Jose, California

Author(s)

• Fallahi, Mahmoud
• Linden, Kurt J.
• Wang, S. C. (Shing Chung)
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Fabrication, testing, and reliability of semiconductor lasers III : 29-30 January, 1998, San Jose, California

Mahmoud Fallahi, Kurt J. Linden, S.C. Wang, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3285）

SPIE, c1998

Other Title

Fabrication, testing, and reliability of semiconductor lasers 3

Fabrication, testing, and reliability of semiconductor lasers three

Note

Includes bibliographical references and author index

Details

• NCID: BA86055145
• ISBN:
  • 0819427241
• LCCN: 2004297445
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Washington
• Pages/Volumes: viii, 232 p.
• Size: 28 cm
• Classification:
  • LCC : TA1700
  • DC22 : 621.36/6
• Subject Headings:
  • LCSH : Semiconductor lasers -- Design and construction -- Congresses
• Parent Bibliography ID:
  • BA0022700X