Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts

Author(s)

• Hicks, John
• De Forest, Peter R.
• Baylor, Vivian M.
• United States. National Institute of Standards and Technology
• National Institute of Justice (U.S.)
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts

John Hicks, Peter R. De Forest, Vivian M. Baylor, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 2941）

SPIE, c1997

Note

Includes bibliographic references and author index

Details

• NCID: BA86159049
• ISBN:
  • 0819423432
• LCCN: 96069891
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash., USA
• Pages/Volumes: v, 148 p.
• Size: 28 cm
• Classification:
  • LCC : HV8073
• Subject Headings:
  • LCSH : Electronics in criminal investigation -- Congresses
  • LCSH : Crime scene searches -- Congresses
  • LCSH : Forensic sciences -- Congresses
  • LCSH : Law enforcement -- Optical equipment -- Congresses
• Parent Bibliography ID:
  • BA0022700X