ISTFA 2007 : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San José McEnery Convention Center San José, California, USA

Author(s)

• International Symposium for Testing and Failure Analysis
• ASM International
• Electronic Device Failure Analysis Society

Bibliographic Information

ISTFA 2007 : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San José McEnery Convention Center San José, California, USA

sponsored by EDFAS, ISTFA, ASM International

ASM International, c2007

Other Title

ISTFA 2007 : conference proceedings from the 33rd International Symposium for Testing and Failure Analysis

Note

Includes bibliographical references and index

Details

• NCID: BA86234676
• ISBN:
  • 9780871708632
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Materials Park, Ohio
• Pages/Volumes: xvi, 356 p.
• Size: 28 cm
• Attached Material: CD-ROM