ISTFA 2007 : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San José McEnery Convention Center San José, California, USA

著者

• International Symposium for Testing and Failure Analysis
• ASM International
• Electronic Device Failure Analysis Society

書誌事項

ISTFA 2007 : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San José McEnery Convention Center San José, California, USA

sponsored by EDFAS, ISTFA, ASM International

ASM International, c2007

タイトル別名

ISTFA 2007 : conference proceedings from the 33rd International Symposium for Testing and Failure Analysis

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA86234676
• ISBN:
  • 9780871708632
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Materials Park, Ohio
• ページ数/冊数: xvi, 356 p.
• 大きさ: 28 cm
• 付属資料: CD-ROM