Trapped charged particles and fundamental interactions

著者

    • Blaum, K.
    • Herfurth, F.

書誌事項

Trapped charged particles and fundamental interactions

K. Blaum, F. Herfurth

(Lecture notes in physics, 749)

Springer, c2008

大学図書館所蔵 件 / 10

この図書・雑誌をさがす

注記

Includes bibliographical references and index

内容説明・目次

内容説明

The development of ion traps has spurred significant experimental activities able to link measurable quantities to the most fundamental aspects of physics. The first chapter sets the scene and motivates the use of ion traps with an in-depth survey of the low-energy electroweak sector of the standard model amenable to precision test. The next parts then introduce and review aspects of the theory, simulation and experimental implementation of such traps. Last but not least, two important applications, namely high resolution mass spectrometry in Penning traps and tests of fundamental physics - such as the CPT theorem - with trapped antiprotons are discussed. This volume bridges the gap between the graduate textbook and the research literature and will assist graduate students and newcomers to the field in quickly entering and mastering the subject matter.

目次

Low-Energy Precision Tests of Electroweak Theory.- Principles of Ion Traps.- Simulations for Ion Traps Methods and Numerical Implementation.- Simulations for Ion Traps Buffer Gas Cooling.- Highly-charged ions and high-resolution mass spectrometry in a Penning trap.- Fundamental tests with trapped antiprotons.

「Nielsen BookData」 より

関連文献: 1件中  1-1を表示

詳細情報

  • NII書誌ID(NCID)
    BA87175164
  • ISBN
    • 9783540778165
  • LCCN
    2008923785
  • 出版国コード
    gw
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Berlin
  • ページ数/冊数
    viii, 192 p.
  • 大きさ
    25 cm
  • 親書誌ID
ページトップへ