Proceedings : the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : DFT 2007 : 26-28 September 2007, Rome, Italy

著者

• IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
• Bolchini, Cristiana

書誌事項

Proceedings : the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : DFT 2007 : 26-28 September 2007, Rome, Italy

edited by Cristiana Bolchini ... [et al.]

IEEE Computer Society, [c2007]

タイトル別名

22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2007)

注記

"IEEE Computer Society Order Number P2885"--T.p. verso

Includes bibliographical references and author index

詳細情報

• NII書誌ID(NCID): BA87699788
• ISBN:
  • 0769528856
• LCCN: 2007931917
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xiv, 537 p.
• 大きさ: 23 cm
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Design and construction -- Congresses
  • LCSH : Fault-tolerant computing -- Congresses