Proceedings : the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : DFT 2007 : 26-28 September 2007, Rome, Italy

Author(s)

• IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
• Bolchini, Cristiana

Bibliographic Information

Proceedings : the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : DFT 2007 : 26-28 September 2007, Rome, Italy

edited by Cristiana Bolchini ... [et al.]

IEEE Computer Society, [c2007]

Other Title

22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2007)

Note

"IEEE Computer Society Order Number P2885"--T.p. verso

Includes bibliographical references and author index

Details

• NCID: BA87699788
• ISBN:
  • 0769528856
• LCCN: 2007931917
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xiv, 537 p.
• Size: 23 cm
• Subject Headings:
  • LCSH : Integrated circuits -- Very large scale integration -- Design and construction -- Congresses
  • LCSH : Fault-tolerant computing -- Congresses