Proceedings : the 1975 Canadian SRE Reliability Symposium, Saturday May 10, 1975, Ottawa, Ontario Canada

著者

• Canadian S.R.E. Reliability Symposium
• Society of Reliability Engineers

書誌事項

Proceedings : the 1975 Canadian SRE Reliability Symposium, Saturday May 10, 1975, Ottawa, Ontario Canada

David Kiang, chairman

（Microelectronics and reliability, vol. 14, no. 2）

Pergamon Press, c1975

• NII書誌ID(NCID): BA89156207
• ISBN:
  • 0080197884
• LCCN: 75012918
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: 73-248 p.
• 大きさ: 28 cm
• 分類:
  • DC : 620/.004/5
• 件名:
  • LCSH : Reliability (Engineering) -- Congresses
• 親書誌ID:
  • BA28297566