Focused ion beams for analysis and processing : November 27 - December 1, 2006, Boston, Massachusetts, USA

著者

• Materials Research Society

書誌事項

Focused ion beams for analysis and processing : November 27 - December 1, 2006, Boston, Massachusetts, USA

（Materials Research Society symposium proceedings, v. 983）

Materials Research Society, c2006

注記

Includes bibliographical references and index

• NII書誌ID(NCID): BA89249363
• ISBN:
  • 9781604234305
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Warrendale, Pa.
• ページ数/冊数: 106 p.
• 大きさ: 24 cm
• 件名:
  • LCSH : Focused ion beams -- Industrial applications -- Congresses
  • LCSH : Micromachining -- Congresses
  • LCSH : Materials -- Analysis -- Congresses
• 親書誌ID:
  • BA00013775