Focused ion beams for analysis and processing : November 27 - December 1, 2006, Boston, Massachusetts, USA

Author(s)

• Materials Research Society

Bibliographic Information

Focused ion beams for analysis and processing : November 27 - December 1, 2006, Boston, Massachusetts, USA

（Materials Research Society symposium proceedings, v. 983）

Materials Research Society, c2006

Note

Includes bibliographical references and index

• NCID: BA89249363
• ISBN:
  • 9781604234305
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Warrendale, Pa.
• Pages/Volumes: 106 p.
• Size: 24 cm
• Subject Headings:
  • LCSH : Focused ion beams -- Industrial applications -- Congresses
  • LCSH : Micromachining -- Congresses
  • LCSH : Materials -- Analysis -- Congresses
• Parent Bibliography ID:
  • BA00013775