Electron energy loss spectroscopy
著者
書誌事項
Electron energy loss spectroscopy
（Microscopy handbooks, 48）
Taylor & Francis, 2006, c2001
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注記
"Transferred to digital printing 2006"--T.p. verso
Originally published: Oxford : Bios in association with the Royal Microscopical Society, 2001
Includes bibliographical references and index
内容説明・目次
内容説明
Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique is used in many modern transmission electron microscopes to characterise materials. This book provides an up-to-date introduction to the principles and applications of EELS. Specific topics covered include, theory of EELS, elemental quantification, EELS fine structure, EELS imaging and advanced techniques.
目次
Abbreviations -- Preface -- Acknowledgements -- 1. Introduction -- What is EELS? -- Interaction of electrons with matter -- Basics of the TEM -- Comparison of EELS in TEM with other spectroscopies -- Conclusions -- References -- 2. The EEL spectrum -- The primary transmitted electron signal -- Historical development -- Basic components of an EEL spectrum -- Basic physics -- Summary of analytical uses -- References -- 3. EELS instrumentation and experimental aspects -- The electron spectrometer -- Coupling a magnetic spectrometer to the microscope -- Spectral recording -- Energy-filtered imaging -- Choice of experimental conditions for EELS -- Specimen parameters -- Summary of experimental set-up and data acquisition procedures for EELS -- Summary of data correction procedures for EELS -- References and further reading -- 4. Low loss spectroscopy -- Quantification of sample thickness -- Quantitative aspects of low loss data -- Experimental aspects of EELS low loss measurements -- Conclusions -- References and further reading -- 5. Elemental quantification -- Quantification of EEL spectra -- Background removal -- Determination of the ionization cross-section -- Final quantification step -- Summary of the quantification procedure -- Summary of experimental quantification parameters -- Accuracy and detection sensitivity of EELS quantification and comparison with EDX in the TEM -- References and further reading -- 6. Fine structure on inner-shell ionization edges (ELNESIEXELFS) -- Origin of edge fine structure -- Determination of coordinations -- Determination of valencies -- Determination of bond lengths -- Experimental aspects of ELNESIEXELFS measurements -- Conclusions -- References and further reading -- 7. EELS imaging -- Introduction to EELS imaging and energy filtering -- Summary of energy-filtering techniques -- Procedure for EFTEM elemental mapping -- Experimental parameters in EFTEM -- Correlation of elemental maps -- General strategy for EFTEM elemental analysis -- Experimental procedure for EFTEM image acquisition and processing -- Comparison of EFTEM and spectrum imaging methods -- Energy-filtered tomography -- Conclusions -- References and further reading -- 8. Advanced EELS techniques in the TEM -- Orientation dependency in EELS -- Spatially resolved measurements -- Electron Compton scattering -- Reflection mode and surface measurements -- References and further reading -- 9. Conclusions -- Further reading -- Further resources -- Index.
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