2007 IEEE International High Level Design Validation and Test Workshop : Irvine, CA, 7-9 November 2007

著者

• IEEE International High Level Design Validation and Test Workshop

書誌事項

2007 IEEE International High Level Design Validation and Test Workshop : Irvine, CA, 7-9 November 2007

IEEE, c2007

注記

Includes bibliographical references and author index

• NII書誌ID(NCID): BA89319196
• ISBN:
  • 9781424414802
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, N.J.
• ページ数/冊数: x, 196 p.
• 大きさ: 28 cm
• 件名:
  • LCSH : Microprocessors -- Testing -- Congresses
  • LCSH : Computer software -- Verification -- Congresses
  • LCSH : Electronic circuits -- Testing -- Congresses
  • LCSH : Electronic digital computers -- Evaluation -- Congresses