Proceedings : the 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : Boston, Massachusetts 1-3 October 2008

著者

• IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
• Bolchini, Cristiana

書誌事項

Proceedings : the 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : Boston, Massachusetts 1-3 October 2008

edited by Cristiana Bolchini ... [et al.]

IEEE Computer Society, c2008

タイトル別名

The 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2008)

注記

"IEEE Computer Society Order Number P3365" -- T.p. verso

Includes bibliographical references and author index

詳細情報

• NII書誌ID(NCID): BA89793186
• ISBN:
  • 9780769533650
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xiii, 546 p.
• 大きさ: 23 cm
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Design and construction -- Congresses
  • LCSH : Fault-tolerant computing -- Congresses