Charged semiconductor defects : structure, thermodynamics and diffusion

Author(s)

• Seebauer, Edmund G.
• Kratzer, Meredith C.

Bibliographic Information

Charged semiconductor defects : structure, thermodynamics and diffusion

Edmund G. Seebauer, Meredith C. Kratzer

（Engineering materials and processes）

Springer, c2009

Note

Includes bibliographical references and index

• NCID: BA89793550
• ISBN:
  • 9781848820586
• LCCN: 2008936490
• Country Code: uk
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: London
• Pages/Volumes: xiv, 294 p.
• Size: 25 cm
• Classification:
  • LCC : QC611.6.D4
  • DC22 : 621.38152
• Subject Headings:
  • LCSH : Semiconductors -- Defects
• Parent Bibliography ID:
  • BA63351761