23rd annual proceedings : Reliability Physics 1985, Orland, Florida, March 26, 27, 28, 1985

著者

• International Reliability Physics Symposium
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

23rd annual proceedings : Reliability Physics 1985, Orland, Florida, March 26, 27, 28, 1985

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Electron Device and Reliability Societies of the Institute of Electrical and Electronics Engineers, c1985

タイトル別名

Reliability Physics

Annual proceedings

IEEE 1985 International Reliability Physics

注記

"1985 International Reliability Physics Symposium"--T.p. verso

General chairman: J.W. Peeples

"IEEE catalog no. 85CH2113-9."

"Library of Congress Catalog Card no. 82-640313."

"A bonus publication from your Reliability Society"--Cover

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BA90167743
• LCCN: 82640313
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York, N.Y.
• ページ数/冊数: viii, 252 p.
• 大きさ: 28 cm
• 件名:
  • LCSH : Electronic apparatus and appliances -- Reliability Congresses
  • LCSH : Electronic apparatus and appliances -- Testing Congresses
  • LCSH : Integrated circuits -- Reliability Congresses
  • LCSH : Integrated circuits -- Testing Congresses