{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA90167743.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA90167743#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA90167743.json"},"dc:title":[{"@value":"23rd annual proceedings : Reliability Physics 1985, Orland, Florida, March 26, 27, 28, 1985"}],"dcterms:alternative":["Reliability Physics","Annual proceedings","IEEE 1985 International Reliability Physics"],"dc:creator":"sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society","dc:publisher":[{"@value":"Electron Device and Reliability Societies of the Institute of Electrical and Electronics Engineers"}],"dcterms:extent":"viii, 252 p.","cinii:size":"28 cm","dc:language":"eng","dc:date":"1985","cinii:ncid":"BA90167743","cinii:ownerCount":"2","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA11572276#entity","@type":"foaf:Person","foaf:name":[{"@value":"International Reliability Physics Symposium"}]},{"@id":"https://ci.nii.ac.jp/author/DA01257512#entity","@type":"foaf:Person","foaf:name":[{"@value":"IEEE Electron Devices Society"}]},{"@id":"https://ci.nii.ac.jp/author/DA03215295#entity","@type":"foaf:Person","foaf:name":[{"@value":"IEEE Reliability Society"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA001652","@type":"foaf:Organization","foaf:name":"筑波大学 附属図書館 中央図書館","rdfs:seeAlso":{"@id":"https://www.tulips.tsukuba.ac.jp/mylimedio/search/search.do?target=local&mode=comp&ncid=BA90167743"}},{"@id":"https://ci.nii.ac.jp/library/FA000106","@type":"foaf:Organization","foaf:name":"東京科学大学 大岡山図書館","rdfs:seeAlso":{"@id":"https://topics.libra.titech.ac.jp/recordID/catalog.bib/BA90167743"}}],"bibo:lccn":["82640313"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/82640313"}],"prism:publicationDate":["c1985"],"cinii:note":["\"1985 International Reliability Physics Symposium\"--T.p. verso","General chairman: J.W. Peeples","\"IEEE catalog no. 85CH2113-9.\"","\"Library of Congress Catalog Card no. 82-640313.\"","\"A bonus publication from your Reliability Society\"--Cover","Includes bibliographical references"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Electronic+apparatus+and+appliances+--+Reliability+Congresses","dc:title":"Electronic apparatus and appliances -- Reliability Congresses"},{"@id":"https://ci.nii.ac.jp/books/search?q=Electronic+apparatus+and+appliances+--+Testing+Congresses","dc:title":"Electronic apparatus and appliances -- Testing Congresses"},{"@id":"https://ci.nii.ac.jp/books/search?q=Integrated+circuits+--+Reliability+Congresses","dc:title":"Integrated circuits -- Reliability Congresses"},{"@id":"https://ci.nii.ac.jp/books/search?q=Integrated+circuits+--+Testing+Congresses","dc:title":"Integrated circuits -- Testing Congresses"}]}]}