Workshop on Radiation Effects and Fault Tolerance in Nanometer Technologies (WREFT 08) : Ischia, Italy, 5 May 2008

Author(s)

• Workshop on Memory Access on Future Processors
• ACM Special Interest Group on Microprogramming
• Association for Computing Machinery

Bibliographic Information

Workshop on Radiation Effects and Fault Tolerance in Nanometer Technologies (WREFT 08) : Ischia, Italy, 5 May 2008

Association for Computing Machinery, c2008

Other Title

WREFT'08 Workshop

Note

Includes bibliographical references and author index

Sponsor: SIGMICRO

Details

• NCID: BA90278518
• ISBN:
  • 9781605609027
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York.
• Pages/Volumes: 33 p.
• Size: 28 cm