Workshop on Radiation Effects and Fault Tolerance in Nanometer Technologies (WREFT 08) : Ischia, Italy, 5 May 2008

著者

• Workshop on Memory Access on Future Processors
• ACM Special Interest Group on Microprogramming
• Association for Computing Machinery

書誌事項

Workshop on Radiation Effects and Fault Tolerance in Nanometer Technologies (WREFT 08) : Ischia, Italy, 5 May 2008

Association for Computing Machinery, c2008

タイトル別名

WREFT'08 Workshop

注記

Includes bibliographical references and author index

Sponsor: SIGMICRO

詳細情報

• NII書誌ID(NCID): BA90278518
• ISBN:
  • 9781605609027
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York.
• ページ数/冊数: 33 p.
• 大きさ: 28 cm