Performance and reliability of semiconductor devices : symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A.

Author(s)

• Mastro, Michael
• Materials Research Society. Meeting

Bibliographic Information

Performance and reliability of semiconductor devices : symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A.

editors, Michael Mastro ... [et al.]

（Materials Research Society symposium proceedings, v. 1108）

Materials Research Society, c2009

Note

Includes bibliographical references and indexes

Details

• NCID: BA90769473
• ISBN:
  • 9781605110806
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Warrendale, Pa.
• Pages/Volumes: xiii, 259 p.
• Size: 24 cm
• Parent Bibliography ID:
  • BA00013775