Test pattern generation using Boolean proof engines

著者

書誌事項

Test pattern generation using Boolean proof engines

by Rolf Drechsler ... [et al.]

Springer, c2009

  • : hbk.

大学図書館所蔵 件 / 全3件

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注記

Other authors: Stephan Eggersglüß, Görschwin Fey, Daniel Tille

Includes bibliographical references and index

内容説明・目次

内容説明

In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.

目次

1 Introduction. 2 Preliminaries. 2.1 Circuits. 2.2 Fault Models. 2.3 Simple ATPG Framework. 2.4 Classical ATPG Algorithms. 2.5 Benchmarking. 3 Boolean Satisfiability. 3.1 SAT Solver. 3.2 Advances in SAT.3.3 Circuit-to-CNF Conversion. 3.4 Circuit-oriented SAT. 4 SAT-based ATPG. 4.1 Basic Problem Transformation. 4.2 Structural Information. 4.3 Experimental Results. 4.4 Summary. 5 Learning Techniques. 5.1 Introductory Example. 5.2 Concepts for Reusing Learned Information. 5.3 Heuristics for ATPG. 5.4 Experimental Results. 5.5 Summary. 6 Multiple-valued Logic. 6.1 Four-Valued Logic. 6.2 Multi-input Gates. 6.3 Experimental Results. 6.4 Summary. 7 Improved Circuit-to-CNF Conversion. 7.1 Hybrid Logic. 7.2 Incremental Instance Generation. 7.3 Experimental Results. 7.4 Summary. 8 Branching Strategies. 8.1 Standard Heuristics of SAT Solvers. 8.2 Decision Strategies. 8.3 Experimental Results. 8.4 Summary. 9 Integration into Industrial Flow. 9.1 Industrial Environment. 9.2 Integration of SAT-based ATPG. 9.3 Test Pattern Compactness. 9.4 Experimental Results. 9.5 Summary. 10 Delay Faults. 10.1 Transition Delay. 10.2 Path Delay. 10.3 Encoding Efficiency for Path Delay Faults. 10.4 Incremental Approach. 10.5 Experimental Results. 10.6 Summary. 11 Summary and Outlook. Bibliography. Index.

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