Surface analysis of polymers by XPS and static SIMS
Author(s)
Bibliographic Information
Surface analysis of polymers by XPS and static SIMS
（Cambridge solid state science series）
Cambridge University Press, 2005, c1998
Digitally printed first paperback version
- : pbk
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Note
Originally published in 1998
Includes bibliographical references (p. 190-193) and index
Description and Table of Contents
Description
This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.
Table of Contents
- 1. Introduction
- 2. X-ray photoelectron spectroscopy (XPS)
- 3. Information from polymer XPS
- 4. Static secondary ion mass spectrometry (SSIMS)
- 5. Information from SSIMS
- 6. Polymer surface analysis case studies
- References.
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