Nanometrology

Author(s)

• Rembiesa, David
• Toth-Fejel, Tihamer T.
• Society of Manufacturing Engineers

Bibliographic Information

Nanometrology

produced by Society of Manufacturing Engineers ; producer/director/editor, David Rembiesa ; written by Tihamer T. Toth-Fejel

Society of Manufacturing Engineers, c2009

DVD-ROM

Computer File（Optical Disc）

Note

Summary: Learn detailed information on the two major types of microscopes in use today, which are based on either an energy beam made up of electrons or ions, or a scanning probe with a sharp tip. The energy beam methods may use electrons, such as in an S-E-M (scanning electron microscope), and the T-E-M (transmission electron microscope), or they may use ionized atoms, such as in the F-I-B (focused ion beam). The scanning probes include the S-T-M (scanning tunneling microscopy), and the A-F-M (atomic force microscopy)

Details

• NCID: BB00811693
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: [Dearborne, MI]
• Pages/Volumes: 1 videodisc (33 min.)
• Size: 19 cm
• Subject Headings:
  • LCSH : Nanostructured materials -- Measurement
  • LCSH : Microscopy -- Measurement
  • LCSH : Nonfiction films
  • FREE : DVD