2009 IEEE International High Level Design Validation and Test Workshop : HLDVT 2009 : San Francisco, California, USA, 4-6 November 2009

Author(s)

• IEEE International High Level Design Validation and Test Workshop

Bibliographic Information

2009 IEEE International High Level Design Validation and Test Workshop : HLDVT 2009 : San Francisco, California, USA, 4-6 November 2009

IEEE, c2009

Note

Includes bibliographical references and author index

• NCID: BB01168140
• ISBN:
  • 9781424448241
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, N.J.
• Pages/Volumes: 175 p.
• Size: 28 cm
• Subject Headings:
  • LCSH : Microprocessors -- Testing -- Congresses
  • LCSH : Computer software -- Verification -- Congresses
  • LCSH : Electronic circuits -- Testing -- Congresses
  • LCSH : Electronic digital computers -- Evaluation -- Congresses