Proceedings of the 1988 International Electronic Devices and Materials Symposium, August 29-31, National Sun Yat-sen University, Kaohsiung, Taiwan R.O.C. : edms

著者

• International Symposium on Corrosion of Electronic Materials and Devices
• Lin, C.Y.

書誌事項

Proceedings of the 1988 International Electronic Devices and Materials Symposium, August 29-31, National Sun Yat-sen University, Kaohsiung, Taiwan R.O.C. : edms

National Sun Yat-sen University, c1988

注記

Sympojium chairman: C.Y. Lin

詳細情報

• NII書誌ID(NCID): BB0127130X
• 出版国コード: ch
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Kaohsiung
• ページ数/冊数: 436 p.
• 大きさ: 30 cm
• 件名:
  • LCSH : Solid state devices -- Congresses
  • LCSH : Semiconductors -- Congresses
  • LCSH : Hybrid integrated circuits -- Congresses