Patent-related misconduct issues in U.S. litigation

著者

• Davidow, Joel

書誌事項

Patent-related misconduct issues in U.S. litigation

Joel Davidow

Oxford University Press, c2010

• : pbk

注記

Includes bibliographical references (p. 203-208) and index

• NII書誌ID(NCID): BB01877493
• ISBN:
  • 9780195337204
• LCCN: 2009042480
• 出版国コード: uk
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Oxford
• ページ数/冊数: xv, 234 p.
• 大きさ: 24 cm
• 分類:
  • LCC : KF3155
  • DC22 : 346.7304/86
• 件名:
  • LCSH : Patent suits -- United States
  • LCSH : Patent infringement -- United States
  • LCSH : Patent laws and legislation -- United States -- Trial practice
  • LCSH : Patent practice -- United States