Electron crystallography for materials research and quantitative characterization of nanostructured materials : symposium held April 14-16, 2009, San Francisco, California, U.S.A.

著者

• Moeck, Peter
• Hovmöller, Sven
• Nicolopoulos, Stavros
• Rouvimov, Sergei
• Petkov, Valeri
• Gateshki, Milen
• Fraundorf, Phil
• Materials Research Society. Spring Meeting

書誌事項

Electron crystallography for materials research and quantitative characterization of nanostructured materials : symposium held April 14-16, 2009, San Francisco, California, U.S.A.

editors, Peter Moeck ... [et al.]

（Materials Research Society symposium proceedings, v. 1184）

Materials Research Society, c2009

注記

Other editors: Sven Hovmöller, Stavros Nicolopoulos, Sergei Rouvimov, Valeri Petkov, Milen Gateshki, Phil Fraundorf

"..., 'Electron crystallography for materials research,' was held April 13-14 at the 2009 MRS Spring Meeting in San Francisco, California."--Pref. of symposium GG

"..., 'Quantitative characterization of nanostructured materials,' held April 14-16 at the 2009 MRS Spring Meeting in San Francisco, California, ..."--Pref. of symposium HH

Includes bibliographical references and indexes

内容説明・目次

内容説明

This book combines the proceedings of Symposium GG, Electron Crystallography for Materials Research, and Symposium HH, Quantitative Characterization of Nanostructured Materials, both from the 2009 MRS Spring Meeting in San Francisco. Papers from Symposium GG focus on the fundamentals and recent progress in electron crystallography and associated strategies for structural fingerprinting of nanocrystals. Some consensus was reached regarding precession electron diffraction and electron diffraction tomography as instrumental breakthroughs leading to ab initio determinations of unknowns with high structural complexity. Some of these unknowns may only exist as nanocrystals. For Symposium HH, experts in a wide variety of probing techniques come together in an effort to find optimal, and often combined, approaches for determining atomic structure at the nanoscale - the problem at the core of nanotechnology.

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詳細情報

• NII書誌ID(NCID): BB02115332
• ISBN:
  • 9781605111575
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Warrendale, Pa.
• ページ数/冊数: viii, 211 p.
• 大きさ: 24 cm
• 親書誌ID:
  • BA00013775