Pattern recognition

Author(s)

• Kanal, Laveen N.
• Agrawala, Ashok K.

Bibliographic Information

Pattern recognition

[by Laveen N. Kanal, Ashok K. Agrawala]

National Technical Information Service, U.S. Dept. of Commerce, [1973]

Note

Facsim. reprint. Originally published: [College Park, Md.] : [Computer Science Center, University of Maryland], [1973]. (Technical report ; TR-264))

"AD-778 940"

"Prefared for Air Force Office of Scientific Research"

"October 1973"

"AFOSR 71-1982"--Original t.p

• NCID: BB0227771X
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Springfield, Va.
• Pages/Volumes: [37] leaves
• Size: 28 cm