Hybrid microcircuit reliability data

Author(s)

• IIT Research Institute
• Rome Air Development Center. Reliability Analysis Center

Bibliographic Information

Hybrid microcircuit reliability data

prepared by IIT Research Institute ; [Reliability Analysis Center, Rome Air Development Center]

Pergamon Press, c1976

Note

"First edition 1975 ; reprinted 1976"--T.p. verso

Details

• NCID: BB03095263
• ISBN:
  • 0080205356
• LCCN: 75029637
• Country Code: uk
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Oxford ; New York
• Pages/Volumes: 208 p.
• Size: 27 cm
• Classification:
  • LCC : TK7874
• Subject Headings:
  • LCSH : Hybrid integrated circuits -- Reliability
  • FREE : Datensammlung. swd
  • FREE : Hybridschaltung. swd