Reliability and radiation effects in compound semiconductors

著者

• Johnston, Allan

書誌事項

Reliability and radiation effects in compound semiconductors

Allan Johnston

World Scientific, c2010

注記

Includes bibliographical references (p. 356) and index

• NII書誌ID(NCID): BB03105345
• ISBN:
  • 9789814277105
• 出版国コード: si
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Singapore ; Hackensack, NJ
• ページ数/冊数: xii, 363 p.
• 大きさ: 24 cm
• 分類:
  • DC22 : 621.38152
• 件名:
  • LCSH : Compound semiconductors -- Reliability
  • LCSH : Compound semiconductors -- Effect of radiation on