Reliability and radiation effects in compound semiconductors

Author(s)

• Johnston, Allan

Bibliographic Information

Reliability and radiation effects in compound semiconductors

Allan Johnston

World Scientific, c2010

Note

Includes bibliographical references (p. 356) and index

Details

• NCID: BB03105345
• ISBN:
  • 9789814277105
• Country Code: si
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Singapore ; Hackensack, NJ
• Pages/Volumes: xii, 363 p.
• Size: 24 cm
• Classification:
  • DC22 : 621.38152
• Subject Headings:
  • LCSH : Compound semiconductors -- Reliability
  • LCSH : Compound semiconductors -- Effect of radiation on