Materials characterization series : surfaces, interfaces, thin films

Author(s)

Bibliographic Information

Materials characterization series : surfaces, interfaces, thin films

series editors, C. Richard Brundle, Charles A. Evans, Jr.

Momentum Press, 2009-

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Note

This series were originally published between 1993 and 1996 by Butterworth-Heinemann

Related Books: 1-2 of 2

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    Momentum Press 2010 Materials characterization series : surfaces, interfaces, thin films / series editors, C. Richard Brundle, Charles A. Evans, Jr.

    : hbk. : case bound

    Available at 1 libraries

  • Characterization of organic thin films

    [Abraham Ulman] ; editors, Yale Strausser and Gray E. McGuire

    Momentum Press c2010 Materials characterization series : surfaces, interfaces, thin films / series editors, C. Richard Brundle, Charles A. Evans, Jr.

    Available at 2 libraries

Details

  • NCID
    BB04791113
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    New York, N.Y.
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