Materials characterization series : surfaces, interfaces, thin films

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書誌事項

Materials characterization series : surfaces, interfaces, thin films

series editors, C. Richard Brundle, Charles A. Evans, Jr.

Momentum Press, 2009-

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注記

This series were originally published between 1993 and 1996 by Butterworth-Heinemann

関連文献： 2件中  1-2を表示

  • Characterization of optical materials

    editor, Gregory J. Exarhos

    Momentum Press 2010 Materials characterization series : surfaces, interfaces, thin films / series editors, C. Richard Brundle, Charles A. Evans, Jr.

    : hbk. : case bound

    所蔵館1館

  • Characterization of organic thin films

    [Abraham Ulman] ; editors, Yale Strausser and Gray E. McGuire

    Momentum Press c2010 Materials characterization series : surfaces, interfaces, thin films / series editors, C. Richard Brundle, Charles A. Evans, Jr.

    所蔵館2館

詳細情報

  • NII書誌ID(NCID)
    BB04791113
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    New York, N.Y.
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