Structural, syntactic, and statistical pattern recognition : joint IAPR international workshop, SSPR & SPR 2010 : Cesme, Izmir, Turkey, August 18 - 20, 2010 : proceedings

Author(s)

• Hancock, Edwin R
• Wilson, Richard C.
• Windeatt, Terry
• Ulusoy, Ilkay
• Escolano, Francisco

Bibliographic Information

Structural, syntactic, and statistical pattern recognition : joint IAPR international workshop, SSPR & SPR 2010 : Cesme, Izmir, Turkey, August 18 - 20, 2010 : proceedings

Edwin R. Hancock ... [et al.](eds.)

（Lecture notes in computer science, 6218）

Springer, 2010

Note

Includes index

Details

• NCID: BB04903818
• ISBN:
  • 9783642149795
• Country Code: gw
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Berlin
• Pages/Volumes: xv, 758p.
• Size: 24cm
• Parent Bibliography ID:
  • BA00009279