Electron microprobe analysis and scanning electron microscopy in geology
著者
書誌事項
Electron microprobe analysis and scanning electron microscopy in geology
Cambridge University Press, 2010, c2005
2nd ed
- : pbk
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注記
"First published 2005, this digitally printed version 2010" --T.p. verso
Includes bibliographical references and index
内容説明・目次
内容説明
Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
目次
- Preface
- Acknowledgements
- 1. Introduction
- 2. Electron-specimen interactions
- 3. Instrumentation
- 4. Scanning electron microscopy
- 5. X-ray spectrometers
- 6. Element mapping
- 7. X-ray analysis (1)
- 8. X-ray analysis (2)
- 9. Sample preparation
- Appendix
- References
- Index.
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