2010 IEEE International Test Conference (ITC 2010) : Austin, Texas, USA, 2-4 November 2010

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Bibliographic Information

2010 IEEE International Test Conference (ITC 2010) : Austin, Texas, USA, 2-4 November 2010

IEEE, c2010

Available at  / 2 libraries

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Note

IEEE Catalog Number: CFP10ITC-PRT

Includes bibliographical references and index

Details

  • NCID
    BB05126018
  • ISBN
    • 9781424472062
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Piscataway, N.J.
  • Pages/Volumes
    831 p.
  • Size
    27 cm
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